[Mo-2B-03] Analysis of Defect-Free Hot Filament CVD-grown 3C-SiC | ICSCRM2019

ICSCRM2019

Sep 29 - Oct 4, 2019Kyoto International Conference Center

Back

ICSCRM2019

Sep 29 - Oct 4, 2019Kyoto International Conference Center

[Mo-2B-03]Analysis of Defect-Free Hot Filament CVD-grown 3C-SiC

*Bart Van Zeghbroeck¹, Ryan R Brow², Tomoko Borsa¹, David Bobela³(1. Univ. of Colorado(United States of America), 2. NREL(United States of America), 3. TrueNano Inc(United States of America))

Back