ICSCRM2019
Sep 29 - Oct 4, 2019Kyoto International Conference Center
ICSCRM2019
Sep 29 - Oct 4, 2019Kyoto International Conference Center
[Tu-1A-03]Impact of humidity stress on blocking reliability for SiC power devices
*Hiroyuki MATSUSHIMA1, Yuki MORI1, Akio SHIMA1(1. Hitachi, Ltd. Research & development Group(Japan))