International Conference on Silicon Carbide and Related Materials (ICSCRM)
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ICSCRM2019
Sep 29
- Oct 4, 2019
Kyoto International Conference Center
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ICSCRM2019
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ICSCRM2019
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ICSCRM2019
Sep 29
- Oct 4, 2019
Kyoto International Conference Center
[Tu-3A-03]
Depth-Resolved Analysis of the SiO
2
/4H-SiC Interface using Low-Energy Muons
*Judith Woerle
1,2
, Thomas Prokscha
2
, Ulrike Grossner
1
(1. ETH Zurich(Switzerland), 2. Paul Scherrer Institute(Switzerland))
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