[AIS1/PRJ1-4L] Image Recognition Using Oxide Semiconductor Crossbar Memristors with Implementation of Slit Detection and Local Autonomous Learning | Proceedings of the International Display Workshops Volume 27 (IDW '20)

Proceedings of the International Display Workshops Volume 27 (IDW '20)

Dec 9 - Dec 11, 2020Virtual Conference

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Proceedings of the International Display Workshops Volume 27 (IDW '20)

Dec 9 - Dec 11, 2020Virtual Conference

[AIS1/PRJ1-4L]Image Recognition Using Oxide Semiconductor Crossbar Memristors with Implementation of Slit Detection and Local Autonomous Learning

*Yuta Takishita¹, Mutsumi Kimura^1,2, Yasuhiko Nakashima¹(1. Nara Institute of Science and Technology(Japan), 2. Ryukoku University(Japan))

https://doi.org/10.36463/idw.2020.0973

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Keywords:

crossbar-memristor,neural-network,neuromorphic,local-autonomous-learning

In this study, we simulated an image recognition system using visual cortex layers and xbar memristor as a full connection layer. The simulation results show that the best accuracy was 69% when the MNIST datasets were used, and it was 23% when the CIFAR-10 datasets were used.

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