Proceedings of the International Display Workshops Volume 27 (IDW '20)

Proceedings of the International Display Workshops Volume 27 (IDW '20)

Dec 9 - Dec 11, 2020Virtual Conference
The International Display Workshops
Proceedings of the International Display Workshops Volume 27 (IDW '20)

Proceedings of the International Display Workshops Volume 27 (IDW '20)

Dec 9 - Dec 11, 2020Virtual Conference

[LCTp2-2]Decrease in Measurement Accuracy of Flexoelectric Coefficient by contamination in Liquid Crystal Materials

*Daiki Fujiwara1, Munehiro Kimura1, Daiki Katsube1(1. Nagaoka University of Technology(Japan))
https://doi.org/10.36463/idw.2020.0125

Keywords:

Nematic,Flexoelectric coefficient,Ellipsometry

It was confirmed that contamination in liquid crystal (LC) deteriorates the reliability
of the estimation of device parameter such as flexoelectric coefficient especially
when measuring the phase difference of LC sample
by means of the symmetric oblique incident transmission ellipsometry with applying DC voltage.