[FMC4-2] Breakthrough for test cost reduction on Micro LED device with electric-luminescence and electrical Test embedded solution | Proceedings of the International Display Workshops Volume 29 (IDW '22)

Proceedings of the International Display Workshops Volume 29 (IDW '22)

Dec 14 - Dec 16, 2022Fukuoka International Congress Center

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Proceedings of the International Display Workshops Volume 29 (IDW '22)

Dec 14 - Dec 16, 2022Fukuoka International Congress Center

[FMC4-2]Breakthrough for test cost reduction on Micro LED device with electric-luminescence and electrical Test embedded solution

*Hiroshi Kaga¹, Kotaro Hasegawa¹, Koji Miyauchi¹(1.ADVANTEST CORPORATION (Japan))

https://doi.org/10.36463/idw.2022.0277

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Keywords:

Micro-LED,mass production,test methodology,high throughput,electroluminescence

To launch up Micro-LED display, the biggest challenge is cost reduction, With the urgent needs to reduce test costs, most critical issues is parallelizing electroluminescence (EL) test. In this paper, we propose super cost-effective test methods (PEMP^TM) embedding EL and electrical test and report its effectiveness and application results.

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