[DXR1-4 (Invited)] Evaluation of Crystal Quality of TlBr Semiconductor Detector | Proceedings of the International Display Workshops Volume 30 (IDW '23)

Proceedings of the International Display Workshops Volume 30 (IDW '23)

Dec 6 - Dec 8, 2023TOKI MESSE Niigata Convention Center

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Proceedings of the International Display Workshops Volume 30 (IDW '23)

Dec 6 - Dec 8, 2023TOKI MESSE Niigata Convention Center

[DXR1-4 (Invited)]Evaluation of Crystal Quality of TlBr Semiconductor Detector

*Kenichi Watanabe¹, Sota Hasegawa¹, Yusuke Sugai¹, Mitsuhiro Nogami², Keitaro Hitomi²(1. Kyushu University (Japan), 2. Tohoku University (Japan))

https://doi.org/10.36463/idw.2023.1428

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Keywords:

Semiconductor detector,TlBr,Neutron diffraction

Thallium bromide (TlBr) is a semiconductor attractive for gamma-ray detectors and imagers. In order to realize a large size TlBr detectors, we should discuss crystal quality. As the crystal quality evaluation methods, we applied neutron Bragg-dip imaging, which is based on the neutron diffraction technique.

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