[AMD1] Oxide TFT (1)

4:40 PM - 5:00 PM JST(7:40 AM - 8:00 AM UTC)Invited

[AMD1-1(Invited)] Improvement in the Reliability for Polycrystalline Indium Oxide Based Thin-Film Transistors by Epitaxial Passivation Layers

Prashant R. Ghediya¹, Yusaku Magari¹, Hikaru Sadahira¹, Takashi Endo¹, Mamoru Furuta², Yuqiao Zhang³, Yasutaka Matsuo¹, *Hiromichi Ohta¹ (1. Hokkaido University (Japan), 2. Kochi University of Technology (Japan), 3. Jiangsu University (China))

Keywords:

Indium oxide,Thin-film transistors,Reliability,Epitaxial growth,Passivation layers

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