Presentation Information

[AMD2-3]Impact of Oxygen Content in IGZO on MW of FeTFTs

*Heyoung Kang1, Seung Hee Cha1, Jae Kyeong Jeong1 (1. Hanyang University (Korea))

Keywords:

IGZO,FeTFT,Oxygen Vacancy,Memory Window

Password required to view

To view or download the proceedings, please log into your Confit account using the "Log in" button.

If you do not have a Confit account, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.

Comment

To browse or post comments, you must log in.Log in