Proceedings of the International Display Workshops Volume 31 (IDW '24)

Proceedings of the International Display Workshops Volume 31 (IDW '24)

Dec 4 - Dec 6, 2024Sapporo Convention Center
The International Display Workshops
Proceedings of the International Display Workshops Volume 31 (IDW '24)

Proceedings of the International Display Workshops Volume 31 (IDW '24)

Dec 4 - Dec 6, 2024Sapporo Convention Center

[AMD3-3]A New Functional Circuit for Selective Scan Driving in Displays

*Minjae Jeong1,2, Young Wook Kim1, Ki Taeg Shin2, Hoon Jeong2, Jeong Ki Park2, Hyun Jae Kim1(1. Yonsei University (Korea), 2. LG Display (Korea))
https://doi.org/10.36463/idw.2024.0193

Keywords:

scan driver,low power,refresh rate,oxide

This paper proposes a new circuit that is composed of 4 transistors, 1 capacitor and additional 3 signals. By adding this circuit to a conventional scan driver, the scan driver can generate scan signals only in a selected area. We fabricated 12-stage scan driver using oxide TFT and verified the output waveform characteristics.