Presentation Information
[DES2-3]Oxide TFT-Based Scan Driver Circuit with Multiple Output Signals using Blocking Structure
*Hwarim Im1, Eun Kyo Jung2, Shin-Hyeong Kim2, Kook Chul Moon2, Yong-Sang Kim2 (1. Konkuk University (Korea), 2. Sungkyunkwan University (Korea))
Keywords:
scan driver circuit,multiple output signals,oxide semiconductor,thin-film transistors,blocking structure
Password required to view
To view or download the proceedings, please log into your Confit account using the "Log in" button.
If you do not have a Confit account, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.
If you do not have a Confit account, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.
orLog in
Comment
To browse or post comments, you must log in.Log in