Proceedings of the International Display Workshops Volume 31 (IDW '24)
Dec 4 - Dec 6, 2024Sapporo Convention Center
Proceedings of the International Display Workshops Volume 31 (IDW '24)
Dec 4 - Dec 6, 2024Sapporo Convention Center
[DES2-3]Oxide TFT-Based Scan Driver Circuit with Multiple Output Signals using Blocking Structure
*Hwarim Im1, Eun Kyo Jung2, Shin-Hyeong Kim2, Kook Chul Moon2, Yong-Sang Kim2(1. Konkuk University (Korea), 2. Sungkyunkwan University (Korea))
Keywords:
scan driver circuit,multiple output signals,oxide semiconductor,thin-film transistors,blocking structure
We propose an oxide thin-film transistor-based scan driver circuit with multiple output signals. The proposed circuit uses a blocking structure to minimize the mutual interferences between multiple output signals. The proposed circuit stably generates multiple outputs with improved output characteristics under threshold voltage variations from –1.0 to 0.6 V.