Presentation Information

[DXR2-2(Invited)]Flexible X-ray Imaging Detectors for Advanced Applications

*Takeshi Fujiwara1, Hidetoshi Kato1, Hiromi Kimura1, Ryoichi Suzuki1 (1. National Institute of Advanced Industrial Science and Technology (Japan))

Keywords:

X-ray imaging,Flexible imager,TFT

Password required to view

To view or download the proceedings, please log into your Confit account using the "Log in" button.

If you do not have a Confit account, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.

Comment

To browse or post comments, you must log in.Log in