[DXR3] Radiation Imaging Systems (2)

1:50 PM - 2:10 PM JST(4:50 AM - 5:10 AM UTC)Invited

[DXR3-2(Invited)] X-ray Talbot-Lau Interferometer and Its Application for Nondestructive Material Inspection

*Tatsuya Yatagawa¹, Tomoki Mori², Siqi Wang², Yutaka Ohtake², Hiromasa Suzuki², Kazuhiro Kido³, Yasunori Tsuboi³ (1. Hitotsubashi University (Japan), 2. The University of Tokyo (Japan), 3. Konica Minolta, Inc. (Japan))

Keywords:

Radiography,Grating interferometer,Nondestructive inspection