Proceedings of the International Display Workshops Volume 31 (IDW '24)
Dec 4 - Dec 6, 2024Sapporo Convention Center
Proceedings of the International Display Workshops Volume 31 (IDW '24)
Dec 4 - Dec 6, 2024Sapporo Convention Center
[DXR3-2(Invited)]X-ray Talbot-Lau Interferometer and Its Application for Nondestructive Material Inspection
*Tatsuya Yatagawa1, Tomoki Mori2, Siqi Wang2, Yutaka Ohtake2, Hiromasa Suzuki2, Kazuhiro Kido3, Yasunori Tsuboi3(1. Hitotsubashi University (Japan), 2. The University of Tokyo (Japan), 3. Konica Minolta, Inc. (Japan))
Keywords:
Radiography,Grating interferometer,Nondestructive inspection
Password required to view
To view or download the proceedings, please log into your A-Pass using the "Log in" button.
If you do not have a A-Pass, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.
If you do not have a A-Pass, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.