[FMC8-3] Quantifying On-Axis and Off-Axis Metrology for Planar and Non-Planar Displays | Proceedings of the International Display Workshops Volume 31 (IDW '24)

Proceedings of the International Display Workshops Volume 31 (IDW '24)

Dec 4 - Dec 6, 2024Sapporo Convention Center

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Proceedings of the International Display Workshops Volume 31 (IDW '24)

Dec 4 - Dec 6, 2024Sapporo Convention Center

[FMC8-3]Quantifying On-Axis and Off-Axis Metrology for Planar and Non-Planar Displays

*K Käläntär^1,2, Elgün Tağiyev²(1. Global Optical Solutions (Japan), 2. Nakhchivan State University (Azerbaijan))

https://doi.org/10.36463/idw.2024.0376

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Keywords:

Planar/non-planar displays,flexible curved display,measurement field contour,measurement artifacts

This paper extends research on quantifying luminance measurement field contours on planar and curved displays, focusing on cylindrical, spherical, and conical shapes. It assesses theoretical on- and off-axis contours, discusses measurement error consequences, and explores strategies to manage these errors in practical luminance measurements.

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