[FMCp2-4] Analysis of Peeling Test Capability With Different RA Condition in Narrow Border LCD | Proceedings of the International Display Workshops Volume 31 (IDW '24)

Proceedings of the International Display Workshops Volume 31 (IDW '24)

Dec 4 - Dec 6, 2024Sapporo Convention Center

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Proceedings of the International Display Workshops Volume 31 (IDW '24)

Dec 4 - Dec 6, 2024Sapporo Convention Center

[FMCp2-4]Analysis of Peeling Test Capability With Different RA Condition in Narrow Border LCD

*Xianfei Zhu¹, Zeyao Li¹, Xiaowu Sun¹, Tian Lan¹, Jianyu Cui¹, Xirong Han¹, Tianhao Zhang¹, Minghong Shi¹, Wade Chen¹(1. Chongqing HKC Optoelectronics Technology Co. Ltd. (China))

https://doi.org/10.36463/idw.2024.0473

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Keywords:

TFT-LCD,Peeling test,Peeling interface,RA

This paper addresses the issue of poor peeling test capability in narrow TFT-LCD display products. By conducting three different RA experimental conditions and observing the cross-section of the peeling test, a systematic analysis of the strong and weak interfaces of the peeling test is performed. This establishes a mapping relationship between the strong and weak interfaces of the peeling test and providing theoretical support for subsequent photomask design.

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