Presentation Information
[IST1-2]Quantization-Error Suppression of a VCO-based ADC
*Yoshihiro Komatsu1, Takuto Togashi1, Tomo Tanaka2, Ryota Yuge2, Masahiko Sano2, Seiji Kurashina2, Masayuki Ikebe1 (1. Hokkaido University (Japan), 2. NEC Corporation (Japan))
Keywords:
Resistive sensor,VCO ADC,integration ADC,quantization error
Password required to view
To view or download the proceedings, please log into your Confit account using the "Log in" button.
If you do not have a Confit account, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.
If you do not have a Confit account, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.
orLog in
Comment
To browse or post comments, you must log in.Log in