[IST1-2]Quantization-Error Suppression of a VCO-based ADC
*Yoshihiro Komatsu1, Takuto Togashi1, Tomo Tanaka2, Ryota Yuge2, Masahiko Sano2, Seiji Kurashina2, Masayuki Ikebe1(1. Hokkaido University (Japan), 2. NEC Corporation (Japan))
Keywords:
Resistive sensor,VCO ADC,integration ADC,quantization error
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