[IST1-2] Quantization-Error Suppression of a VCO-based ADC | Proceedings of the International Display Workshops Volume 31 (IDW '24)

Proceedings of the International Display Workshops Volume 31 (IDW '24)

Dec 4 - Dec 6, 2024Sapporo Convention Center

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Proceedings of the International Display Workshops Volume 31 (IDW '24)

Dec 4 - Dec 6, 2024Sapporo Convention Center

[IST1-2]Quantization-Error Suppression of a VCO-based ADC

*Yoshihiro Komatsu¹, Takuto Togashi¹, Tomo Tanaka², Ryota Yuge², Masahiko Sano², Seiji Kurashina², Masayuki Ikebe¹(1. Hokkaido University (Japan), 2. NEC Corporation (Japan))

https://doi.org/10.36463/idw.2024.1538

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Keywords:

Resistive sensor,VCO ADC,integration ADC,quantization error

We have developed a method to convert the current generated by a resistance change sensor array into digital values using VCO-ADCs or integrating ADC. However, VCO-ADC has a quantization error problem, while integrating ADC has a conversion time problem. Therefore, we propose an ADC that combines both methods and compensates for their shortcomings.

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