Presentation Information
[IST1-2]Quantization-Error Suppression of a VCO-based ADC
*Yoshihiro Komatsu1, Takuto Togashi1, Tomo Tanaka2, Ryota Yuge2, Masahiko Sano2, Seiji Kurashina2, Masayuki Ikebe1 (1. Hokkaido University (Japan), 2. NEC Corporation (Japan))
Keywords:
Resistive sensor,VCO ADC,integration ADC,quantization error