Presentation Information
[IST2-2]A CMOS Temperature Sensor with Threshold Voltage Compensation
*Takuto Togashi1, Yoshihiro Komatsu1, Tomo Tanaka2, Ryota Yuge2, Masahiko Sano2, Seiji Kurashina2, Masayuki Ikebe1 (1. Hokkaido University (Japan), 2. NEC Corporation (Japan))
Keywords:
Temperature sensor,Subthreshold region,Digital calibration,Single-slope ADC
Password required to view
To view or download the proceedings, please log into your Confit account using the "Log in" button.
If you do not have a Confit account, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.
If you do not have a Confit account, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.
orLog in
Comment
To browse or post comments, you must log in.Log in