[IST5-4L] Internal Compensation Pixel Circuit for X-ray Sensor Under Depletion Mode Oxide TFT | Proceedings of the International Display Workshops Volume 31 (IDW '24)

Proceedings of the International Display Workshops Volume 31 (IDW '24)

Dec 4 - Dec 6, 2024Sapporo Convention Center

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Proceedings of the International Display Workshops Volume 31 (IDW '24)

Dec 4 - Dec 6, 2024Sapporo Convention Center

[IST5-4L]Internal Compensation Pixel Circuit for X-ray Sensor Under Depletion Mode Oxide TFT

*Jang Hoo Lee¹, Young Jin Kim¹, Hye Won Yun¹, Seung Jae Moon², Byung Seong Bae¹(1. Hoseo University (Korea), 2. Ulsan National Institute of Science and Technology (UNIST) (Korea))

https://doi.org/10.36463/idw.2024.1578

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Keywords:

oxide TFT,pixel circuit,sensor,depletion,compensation

Oxide thin-film transistors (TFTs) exhibit high stability under X-ray exposure but show a negative V_TH shift, causing reliability issues. The proposed pixel circuit uses an internal compensation structure, reducing the maximum error rate to 6.5%. This improves error rates compared to conventional pixel circuits.

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