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Characterization of Electrical Crosstalk in PbS Quantum Dot CMOS Image Sensors for Ultra-High-Resolution Imaging

The electrical crosstalk of QD-based CMOS image sensors is studied in this work. We modified existing crosstalk models to suit QD-CIS systems and designed specialized electrode patterns to analyze electrical crosstalk in multi-pixel QD photodiode devices, refining predictions and improving sensor architecture for high-quality imaging applications.

The International Display Workshops

Proceedings of the International Display Workshops Volume 31 (IDW '24)

Proceedings of the International Display Workshops Volume 31 (IDW '24)

[ISTp1-1]Characterization of Electrical Crosstalk in PbS Quantum Dot CMOS Image Sensors for Ultra-High-Resolution Imaging

Keywords: