Presentation Information

[MEET1-3(Invited)]Carbon Nanotube Based Cold Cathode Electron Beam (C-beam) for Semiconductor Manufacturing Process

*Kyu Chang Park1, Iksu Kim1, Umesh Balaso1 (1. Kyung Hee University (Korea))

Keywords:

CNT(carbon nanotube),EUV(extreme ultraviolet),Electron beam,Hole drilling,microscopy

Password required to view

To view or download the proceedings, please log into your Confit account using the "Log in" button.

If you do not have a Confit account, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.

Comment

To browse or post comments, you must log in.Log in