[OLEDp2-7] Enhancement of Blue TADF OLED Stability through Reduction of Electron Trapping and Interface Charge Accumulation | Proceedings of the International Display Workshops Volume 31 (IDW '24)

Proceedings of the International Display Workshops Volume 31 (IDW '24)

Dec 4 - Dec 6, 2024Sapporo Convention Center

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Proceedings of the International Display Workshops Volume 31 (IDW '24)

Dec 4 - Dec 6, 2024Sapporo Convention Center

[OLEDp2-7]Enhancement of Blue TADF OLED Stability through Reduction of Electron Trapping and Interface Charge Accumulation

*Jung Ho Ham¹, Young Hun Jung¹, Byung Doo Chin², Jang Hyuk Kwon¹(1. Kyung Hee University (Korea), 2. Dankook University (Korea))

https://doi.org/10.36463/idw.2024.0661

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Keywords:

Thermally Activated Delayed Fluorescence,Mobility,Degradation,Recombination zone

We report that causes of device degradation of blue thermally activated delayed fluorescence (TADF) devices are either electron trapping into dopants and electron accumulation at the interface of hole transport layer. Our TADF device achieved a maximum external quantum efficiency (EQEmax) of 27.6% and a 1.5-fold improvement in lifetime (LT90) at an initial luminance of 1000 cd/m².

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