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Mitigating Early Degradation in Solution-Processed OLEDs Through Interfacial Charge Management

The incorporation of dETL facilitated the increased exciton recombination resulting in a 133% improvement in efficiency and a 300% increase in device lifetime (LT95). Moreover, degradation in the emitting layer was diminished by changing the degradation zone to the dETL, as confirmed by laser desorption/ionization-time of flight (LDI-TOF) analysis.

The International Display Workshops

Proceedings of the International Display Workshops Volume 31 (IDW '24)

Proceedings of the International Display Workshops Volume 31 (IDW '24)

[OLEDp4-6L]Mitigating Early Degradation in Solution-Processed OLEDs Through Interfacial Charge Management

Keywords: