Presentation Information

[IST5-03L(Invited)]Development of VGA Format High Detectivity Microbolometer FPAs using Semi-Conducting SWCNT Networks

*Tomo Tanaka1,2, Masahiko Sano1, Masataka Noguchi1,2, Megumi Kanaori2, Toshie Miyamoto1,2, Ryota Yuge1,2 (1. NEC Corporation (Japan), 2. The National Institute of Advanced Science and Technology (Japan))

Keywords:

Infrared detector,Focal plane array,Carbon nanotube,Microbolometer


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