The 32nd International Display Workshops (IDW '25)
Dec 2 - Dec 5, 2025International Convention Center Hiroshima
The 32nd International Display Workshops (IDW '25)
Dec 2 - Dec 5, 2025International Convention Center Hiroshima
[IST5-3L(Invited)]Development of VGA Format High Detectivity Microbolometer FPAs using Semi-Conducting SWCNT Networks
*Tomo Tanaka1,2, Masahiko Sano1, Masataka Noguchi1,2, Megumi Kanaori2, Toshie Miyamoto1,2, Ryota Yuge1,2(1. NEC Corporation (Japan), 2. The National Institute of Advanced Science and Technology (Japan))
Keywords:
Infrared detector,Focal plane array,Carbon nanotube,Microbolometer
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