The 32nd International Display Workshops (IDW '25)
Dec 2 - Dec 5, 2025International Convention Center Hiroshima
The 32nd International Display Workshops (IDW '25)
Dec 2 - Dec 5, 2025International Convention Center Hiroshima
[LCT1-4]Research on the Process Method of Reducing the Reflectivity of TFT-LCD
*Tenghui He1, Wenping Yang1, Huihua Liao1, Kang Long1, Feng Liu1, Wenzhang Zhao1, Chen i Huang1, James Hsu1, Wade Chen1(1. Changsha HKC Optoelectronics Technology (China))
Keywords:
Refractive Index,Reflectance,Black Matrix on Array(BOA),Metal Oxide Film Layer,Transparent Organic Layer
Password required to view
To view or download the proceedings, please log into your A-Pass using the "Log in" button.
If you do not have a A-Pass, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.
If you do not have a A-Pass, enter the password provided by the IDW Secretariat in the designated box and click the "Authenticate" button.