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The 60th JSAP Spring Meeting,2013
Mar 27
- Mar 30, 2013
Kanagawa Institute of Technology,Japan
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The 60th JSAP Spring Meeting,2013
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The 60th JSAP Spring Meeting,2013
Mar 27
- Mar 30, 2013
Kanagawa Institute of Technology,Japan
[27a-PA5-9]
A study about the small defect and small particle detection on thin film by Glancing method of Multi-angular Images by the cross Correlation
○
Masashi Yamamoto
1
, Mitunori Tone
2
, Hiroshi Kubota
1
(Kumamoto Univ. GSST
1
, Kumamoto Univ.
2
)
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