The 62nd JSAP Spring Meeting, 2015
Mar 11 - Mar 14, 2015Shonan Campus, Tokai University
The 62nd JSAP Spring Meeting, 2015
Mar 11 - Mar 14, 2015Shonan Campus, Tokai University
[11a-A12-13]Tip-sample distance dependence of near-field light imaging by using force detection
〇Junsuke Yamanishi1, Takashi Tokuyama1, Yoshitaka Naitoh1, Yanjun Li1, Yasuhiro Sugawara1(1.Osaka Univ.)
Keywords:
near-field light,atomic force microscopy,scanning probe microscopy