The 79th JSAP Autumn Meeting, 2018
Sep 18 - Sep 21, 2018Nagoya Congress Center
The 79th JSAP Autumn Meeting, 2018
Sep 18 - Sep 21, 2018Nagoya Congress Center
[18p-225A-3]A Study on Single Event Mitigation Techniques for Nano-Scale Semiconductor Devices
〇(D)Akifumi Maru1,2, Akifumi Matsuda1, Mamoru Yoshimoto1(1.Tokyo Tech, 2.JAXA)
Keywords:
semiconductor,radiation
To prevent the affect of charge sharing phenomenon, it is significantly important to estimate the area of charge distribution which generated by single radiation. The estimation techniques for charge sharing by using device simulator is proposed in this study.