The 65h JSAP Spring Meeting, 2018

The 65h JSAP Spring Meeting, 2018

Mar 17 - Mar 20, 2018Nishi-waseda Campus, Waseda University / bell salle Takadanobaba
Back
JSAP Spring / Autumn Meeting
The 65h JSAP Spring Meeting, 2018

The 65h JSAP Spring Meeting, 2018

Mar 17 - Mar 20, 2018Nishi-waseda Campus, Waseda University / bell salle Takadanobaba

[18p-F202-15]A Study of Single Event Mitigation Techniques for Nano-Scale Semiconductor Devices

〇(D)Akifumi Maru1,2, Akifumi Matsuda1, Mamoru Yoshimoto1(1.Tokyo tech, 2.JAXA)
Download PDFDownload PDF

Keywords:

semiconductor,radiation,single event

To prevent the affect of charge sharing phenomenon, it is significantly important to estimate the area of charge distribution which generated by single radiation. The estimation techniques for charge sharing by using device simulator is proposed in this study.
Back