The 66th JSAP Spring Meeting, 2019

The 66th JSAP Spring Meeting, 2019

Mar 9 - Mar 12, 2019Tokyo Institute of Technology, Ookayama Campus
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JSAP Spring / Autumn Meeting
The 66th JSAP Spring Meeting, 2019

The 66th JSAP Spring Meeting, 2019

Mar 9 - Mar 12, 2019Tokyo Institute of Technology, Ookayama Campus

[11p-PA1-8]Electrical conductivity measurement of p-type conductive SrCuSeF and BaCuSeF at ultra-high pressure using a diamond anvil cell

〇Yoshiyuki Okuda1, Akira Yamada2, Kenji Ohta1, Tsuyoshi Maeda3, Takahiro Wada3, Kei Hirose4,5(1.Tokyo Tech EPS, 2.Tokyo Tech EEE, 3.Ryukoku Univ., 4.ELSI, 5.UTokyo EPS)
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Keywords:

Electrical conductivity,diamond anvil cell,semiconductor

太陽電池素材およびp型透明伝導膜(TCO)としても注目を集めているSrCuSeFおよびBaCuSeFの高圧力下における電気伝導度測定を行い，理論計算によるこれらの試料の高圧力下におけるバンドギャップの振る舞いとの相関を調べた．
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