20210727162012067_ja.png

Change account information such as the email address and password on the account setting screen common to Confit.

Login required to view

Password required to view

Presentation Information

Session Details

To browse or post comments, you must log in.

You cannot post comments as it is outside the comment posting period.

This comment has been deleted. You cannot reply to this comment.

Program Type

Announcements

Sessions

Profile management

Bookmark

Search presentations

Download PDF for print

Timetable

Evaluation of cfrystalline silicon photovaltaic by HAXPES

In order to improve the efficiency of crystalline silicon solar cells, the factors that deteriorated the conversion efficiency were evaluated using hard X-ray photoelectron spectroscopy (HAXPES). In particular, evaluation of characteristic deterioration factors related to transparent conductive films used in SHJ solar cells. New carrier selective contact materials such as titanium oxide (TiOx) and transition metal dicalgogenide (TMD), which is a two-dimensional layered material.

日本表面真空学会学術講演会

JVSS 2021

JVSS 2021

[1Aa08]Evaluation of cfrystalline silicon photovaltaic by HAXPES