[1Ap04]In Situ/Operando XPS Measurements
*Takuya Masuda1(1. National Institute for Materials Science)
We have developed a novel XPS system integrated with an environment cell, a bias application module and a non-air exposure sample transfer vessel for in situ/operando measurements of liquid samples, solid/liquid and solid/solid interfaces using a conventional laboratory-based apparatus. A few examples such as quantitative detection of solution species and reaction analysis of electrochemical lithiation/delithiation of a silicon negative electrode deposited on a solid electrolyte will be presented.
