SISPAD2023
Sep 26 - Sep 29, 2023
SISPAD2023
Sep 26 - Sep 29, 2023
[Session_5-03]Self-Heating Influence on Hot Carrier Degradation Reliability of GAA FET by 3D KMC Method
*Songhan Zhao1, Pan Zhao1, Yandong He1, Gang Du1(1. School of Integrated Circuits, Peking University)