[Session_7-02]Quantum Modeling of Semiconductor Leakage Currents Induced by Defects
Antoine Jay1, Clément Mesnard1, Isobel Nicholson2, Rémi Helleboid2, Gabriel Mugny2, *Denis Rideau2, Vincent Goiffon3, Layla Martin-Samo5, Nicolas Richard4, Anne Hémeryck1(1. Lab. d'analyse et d'architecture des systèmes, CNRS, Univ. de Toulouse, 2. ST Microelectronics, 3. ISAE-SUPAERO, 4. CEA/DIF, Bruyères-le-Châtel, 5. CNR-IOM, Democritos National Simulation Center, Istituto Officina dei Materiali, c/o SISSA)
