1981 Conference on Solid State Devices
Aug 26 - Aug 27, 1981The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
1981 Conference on Solid State Devices
Aug 26 - Aug 27, 1981The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
[A-2-6]Soft Error Rate Analysis Model(SERAM) for Dynamic NMOS RAMs
Masaaki Aoki, Toru Toyabe, Takashi Shinoda, Toshiaki Masuhara, Shojiro Asai, Hiroshi Kawamoto, Kazumichi Mitsusada(1.Central Research Laboratory, Hitachi Ltd., 2.Device Development Center, Hitachi Ltd.)
