1993 International Conference on Solid State Devices and Materials

1993 International Conference on Solid State Devices and Materials

Aug 29 - Sep 1, 1993Makuhari Messe, Chiba, Japan
International Conference on Solid State Devices and Materials
1993 International Conference on Solid State Devices and Materials

1993 International Conference on Solid State Devices and Materials

Aug 29 - Sep 1, 1993Makuhari Messe, Chiba, Japan

[S-II-3]Hot-Carrier Related Phenomenon in MOSFETs with Furnace N2O-Nitrided Gate Oxides

G. W. Yoon, J. Ahn, G. Q. Lo, D. L. Kwong(1.Microelectronics Research Center The University of Texas at Austin)
https://doi.org/10.7567/SSDM.1993.S-II-3