2003 International Conference on Solid State Devices and Materials
Sep 16 - Sep 18, 2003Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan
2003 International Conference on Solid State Devices and Materials
Sep 16 - Sep 18, 2003Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan
[A-2-1]Enhancement of VTH Degradation under NBT Stress due to Hole Capturing
Yuichiro Mitani, Makoto Nagamine, Hideki Satake, A. Toriumi(1.Advanced LSI Technology Laboratory, Corporate R&D Center, Toshiba Corporation, 2.Department of Materials Science, The University of Tokyo)
