2003 International Conference on Solid State Devices and Materials
Sep 16 - Sep 18, 2003Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan
2003 International Conference on Solid State Devices and Materials
Sep 16 - Sep 18, 2003Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan
[A-2-2]New Mechanism for Negative-Bias-Temperature Instability and Its Impact on Scaling of pMOSFETs
Da-Yuan Lee, Horng-Chih Lin, Chi-Chun Chen, Chao-Hsin Chien, Tiao-Yuan Huang, Tahui Wang, Tze-Liang Lee, Shih-Chang Chen, Mong-Song Liang(1.Institute of Electronics, National Chiao-Tung University, 2.National Nano Device Laboratories, 3.Taiwan Semiconductor Manufacturing Company)
