2003 International Conference on Solid State Devices and Materials
Sep 16 - Sep 18, 2003Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan
2003 International Conference on Solid State Devices and Materials
Sep 16 - Sep 18, 2003Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan
[A-2-3]Origin of Enhanced Thermal Noise for 100nm-MOSFETs
S. Hosokawa, Y. Shiraga, H. Ueno, M. Miura-Mattausch, H.J. Mattausch, T. Ohguro, S. Kumashiro, M. Taguchi, H. Masuda, S. Miyamoto(1.Graduate School of Advanced Sciences of Matter, 2.Research Center for Nanodevices and Systems, Hiroshima University, 3.Semiconductor Technology Academic Research Center)
