International Conference on Solid State Devices and Materials

2016 International Conference on Solid State Devices and Materials

Sep 26 - Sep 29, 2016Tsukuba International Congress Center, Tsukuba, Japan

International Conference on Solid State Devices and Materials

2016 International Conference on Solid State Devices and Materials

Sep 26 - Sep 29, 2016Tsukuba International Congress Center, Tsukuba, Japan

[A-6-01(Invited)]Bias Temperature Instability in Tunnel FETs

^○W. Mizubayashi¹, T. Mori¹, K. Fukuda¹, Y. Ishikawa¹, Y. Morita¹, S. Migita¹, H. Ota¹, Y. X. Liu¹, S. O'uchi¹, J. Tsukada¹, H. Yamauchi¹, T. Matsukawa¹, M. Masahara¹, K. Endo¹(1.AIST(Japan))

https://doi.org/10.7567/SSDM.2016.A-6-01