2016 International Conference on Solid State Devices and Materials

2016 International Conference on Solid State Devices and Materials

Sep 26 - Sep 29, 2016Tsukuba International Congress Center, Tsukuba, Japan
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International Conference on Solid State Devices and Materials
2016 International Conference on Solid State Devices and Materials

2016 International Conference on Solid State Devices and Materials

Sep 26 - Sep 29, 2016Tsukuba International Congress Center, Tsukuba, Japan

[A-7-02]Drain-Bias Dependency on Statistical Variability for Tunnel Field-Effect Transistors

○W. Y. Choi1, S. H. Choi1, J. W. Lee1, I. Huh1(1.Sogang Univ.(Korea))
https://doi.org/10.7567/SSDM.2016.A-7-02
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