2016 International Conference on Solid State Devices and Materials
Sep 26 - Sep 29, 2016Tsukuba International Congress Center, Tsukuba, Japan
2016 International Conference on Solid State Devices and Materials
Sep 26 - Sep 29, 2016Tsukuba International Congress Center, Tsukuba, Japan
[B-2-03]Highly Reliable MTJ-Based Nonvolatile Logic-in-Memory LSI with Content-Aware Write Error Masking Scheme
○M. Natsui1, A. Tamakoshi1, T. Endoh1, H. Ohno1, T. Hanyu1(1.Tohoku Univ.(Japan))
