2016 International Conference on Solid State Devices and Materials
Sep 26 - Sep 29, 2016Tsukuba International Congress Center, Tsukuba, Japan
2016 International Conference on Solid State Devices and Materials
Sep 26 - Sep 29, 2016Tsukuba International Congress Center, Tsukuba, Japan
[B-2-05]Long-Term Reliable Physically Unclonable Function using Oxide Tunnel Barrier Breakdown on 2T-2MTJ Based Embedded-STT-MRAM
○S. Takaya1, T. Tanamoto1, H. Noguchi1, K. Ikegami1, K. Abe1, S. Fujita1(1.Toshiba Corp.(Japan))
