International Conference on Solid State Devices and Materials
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2020 International Conference on Solid State Devices and Materials
Sep 27
- Sep 30, 2020
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2020 International Conference on Solid State Devices and Materials
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2020 International Conference on Solid State Devices and Materials
Sep 27
- Sep 30, 2020
[A-1-05]
Thickness Scaling on Ferroelectric Al
0.8
Sc
0.2
N Films
〇Sunglin TSAI
1
, Takuya Hoshii
1
, Hitoshi Wakabayashi
1
, Kazuo Tsutsui
1
, Kuniyuki Kakushima
1
(1. Tokyo Inst.of Tech.(Japan))
https://doi.org/10.7567/SSDM.2020.A-1-05
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