[SO-PS-02] 02: Advanced and Emerging Memories / New Applications

2:04 PM - 2:06 PM JST(5:04 AM - 5:06 AM UTC)

[SO-PS-02-18] Predictive Model of High Source-Drain Voltage induced Degradation of Select Transistors in Nonvolatile Memory Arrays

〇Junru Qu¹, Dong Liu², Jiabao Ye¹, Bing Chen³, Ran Cheng¹, Xiao Yu³, Yan Liu³, Genquan Han³ (1. College of Integrated Circuit, Zhejiang University, Hangzhou, China (China), 2. Polytechnic Institution, Zhejiang University, Hangzhou, China (China), 3. Hangzhou Institute of Technology, Xidian University, Hangzhou, China (China))