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An overview on near field and related scanning methods in EMC

The workshop introduces near field scanning techniques for both immunity and emissions and critically analyzes their abilities and limitations. The following techniques will be discussed: Near Field Scanning: • Settings such as probes, time needed, resolution, sensitivity, scanning strategies • Data processing of near field data such as A vs. B, synchronized scanning, near to far field transformation Emission Source Microscopy (ESM), this is a method similar to near field scanning, but it ONLY shows the radiating sources and suppresses the none radiating near field: • Mathematical base of ESM • Phase measurement in scanning • Ability and Limit of ESM • Processing such as masking, radiation pattern • Related holographic methods RF susceptibility scanning, here a local probe injects an RF signal locally and the system response is observed. This is useful for finding the root cause of RF Immunity failures. • Implementation • Ability and Limits ESD susceptibility scanning, here, locally pulsed signals having &lt; 500ps risetime are injected mostly via field coupling and the system response is observed. This is for the root cause analysis of ESD induced soft failures in electronic system. • Implementation • Ability and Limits Finally, the workshop will discuss aspects in which scanning can and should be improved.

IEEE EMC Japan / APEMC

EMC Japan/APEMC Okinawa

EMC Japan/APEMC Okinawa

[WedPM2E.2]An overview on near field and related scanning methods in EMC