1984 International Conference on Solid State Devices and Materials

1984 International Conference on Solid State Devices and Materials

1984年8月30日〜9月1日International Conference Center Kobe, Kobe, Japan
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International Conference on Solid State Devices and Materials
1984 International Conference on Solid State Devices and Materials

1984 International Conference on Solid State Devices and Materials

1984年8月30日〜9月1日International Conference Center Kobe, Kobe, Japan

[B-3-1]Short-Term and Long-Term Reliability of Nitrided Oxide MISFET's

Toru KAGA、Takahisa KUSAKA、Takaaki HAGIWARA、Yuji YATSUDA、Kiichiro MUKAI(1.CENTRAL RESEARCH LABORATORY, HITACHI Ltd.)
https://doi.org/10.7567/SSDM.1984.B-3-1
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