1985 Conference on Solid State Devices and Materials

1985 Conference on Solid State Devices and Materials

1985年8月25日〜8月27日Nippon Toshi Center, Tokyo, Japan
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International Conference on Solid State Devices and Materials
1985 Conference on Solid State Devices and Materials

1985 Conference on Solid State Devices and Materials

1985年8月25日〜8月27日Nippon Toshi Center, Tokyo, Japan

[A-1-5]Comparison of α-Particle Induced Charge Collection on MOS Capacitors Using a DC Tester

Phil OLDIGES、Tohru FURUYAMA(1.Semiconductor Device Engineering Lab. Toshiba Corp.、2.Dept. of Elect. Engineering Cornell University)
https://doi.org/10.7567/SSDM.1985.A-1-5
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