1987 Conference on Solid State Devices and Materials

1987 Conference on Solid State Devices and Materials

1987年8月25日〜8月27日Nippon Toshi Center, Tokyo, Japan
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International Conference on Solid State Devices and Materials
1987 Conference on Solid State Devices and Materials

1987 Conference on Solid State Devices and Materials

1987年8月25日〜8月27日Nippon Toshi Center, Tokyo, Japan

[A-2-2]Initial Stage Degradation Mechanism in Hot-Carrier Effects

Yasuo lgura、Kazunori Umeda、Eiji Takeda(1.Central Research Laboratory, Hitachi Ltd.)
https://doi.org/10.7567/SSDM.1987.A-2-2
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