1991 International Conference on Solid State Devices and Materials

1991 International Conference on Solid State Devices and Materials

1991年8月27日〜8月29日Pacifico Yokohama, Yokohama, Japan
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International Conference on Solid State Devices and Materials
1991 International Conference on Solid State Devices and Materials

1991 International Conference on Solid State Devices and Materials

1991年8月27日〜8月29日Pacifico Yokohama, Yokohama, Japan

[A-1-3]Spatial Distribution of Trapped Holes in the Oxide of MOSFETs after Uniform Hot-Hole Injection

QUAZI Deen Mohd Khosru、Naoki YASUDA、Akinori MARUYAMA、Kenji TANIGUCHI、Chihiro HAMAGUCHI(1.Department of Electronic Engineering, Osaka University)
https://doi.org/10.7567/SSDM.1991.A-1-3
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