1991 International Conference on Solid State Devices and Materials

1991 International Conference on Solid State Devices and Materials

1991年8月27日〜8月29日Pacifico Yokohama, Yokohama, Japan
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International Conference on Solid State Devices and Materials
1991 International Conference on Solid State Devices and Materials

1991 International Conference on Solid State Devices and Materials

1991年8月27日〜8月29日Pacifico Yokohama, Yokohama, Japan

[A-1-4]The Influence of Synchrotron X-Ray Damage on Hot-Carrier-Induced Degradation in Subquarter-Micron NMOSFETs

T. Tsuchiya、M. Harada、K. Deguchi、T. Matsuda(1.NTT LSI Laboratories)
https://doi.org/10.7567/SSDM.1991.A-1-4
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